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J. Renewable Sustainable Energy 4, 011602 (2012); http://dx.doi.org/10.1063/1.3676073 (12 pages)
Effect of indium doping on physical properties of nanocrystallized SnS zinc blend thin films grown by chemical bath deposition
(Received 23 July 2011; accepted 11 December 2011; published online 8 February 2012)
= 4%,6%,8%,and10%). The structure, the surface morphology, and the optical properties of the SnS:In films were studied by x-ray diffraction, scanning electron microscope, atomic force microscopy, and spectrophotometer measurements. In order to obtain a thickness of the order of 308 ± 10 nm for potential applications in solar cell devices, a multilayer deposition has been prepared. It is found that the physical properties of tin sulphide are affected by indium concentration. In fact, x-ray diffraction study showed that better crystallinity in zinc blend structure with preferential orientations (111)ZB and (200)ZB was obtained for y equal to 6%. According to the AFM analysis, we remark that low average surface roughness value of SnS(ZB) thin film is obtained with In concentrations equal to y = 6%. Energy dispersive spectroscopy showed the existence of In, Sn, and S in the films. Optical analyses by means of transmission T(λ) and reflection R(λ) measurements show 1.57 eV as an optical band gap value of SnS:In(6%), which is lower than the previously obtained value (1.76 eV) for undoped tin sulphide. In doped tin sulphide exhibits a high absorption coefficient 2.5 × 106 cm−1, indicating that SnS:In can be used as absorber thin layer in photovoltaic structure such as SnS:In/ZnS/SnO2:F and SnS:In/In2S3/SnO2:F, where ZnS and In2S3 are chemically deposited as described in a previous work. In this study, the hetero-junctions SnS/In2S3:Al and SnS/ZnS:In are also investigated.© 2012 American Institute of Physics
Article Outline
- INTRODUCTION
- EXPERIMENTAL DETAILS
- Substrate cleaning
- Reagents and preparation of solution
- The chemical solution
- Characterisation of SnS thin films
- RESULTS AND DISCUSSION
- Structural analysis
- Morphological analysis
- Optical analysis
- HETEROJUNCTION DESCRIPTION
- I(V) measurements
- CONCLUSION
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KEYWORDS, PACS, and IPC
Keywords
absorption coefficients, atomic force microscopy, doping, indium, liquid phase deposition, nanofabrication, nanostructured materials, scanning electron microscopy, spectrophotometers, surface morphology, surface roughness, thin films, X-ray diffraction
PACS
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Nanocrystalline materials
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Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)
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Other materials
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Insulators
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Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
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Nanocrystals, nanoparticles, and nanoclusters
International Patent Classification (IPC)
Processes for applying liquids or other fluent materials
Nano-structures
Manufacture or treatment of nano-structures
Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
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